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Johnson

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1 paper
title: Limitations on the resolution of YAG:Ce beam profile monitor for high brightness electron beam
format: conference procceeding
conference: 2nd ICFA Advanced Accelerator Workshop on the Physics of High Brightness Beams
year: 2000
8 authors: A. Murokh | Yakimenko | V. | Johnson | E. | Wang | X. J. | J. B. Rosenzweig
abstract: The performance of single crystal YAG:Ce (Y_(3)Al_(5)O_(12)) beam profile monitors was studied for transverse masurements on the high brightness ultrarelativistic electron beam at Accelerator Test Facility (ATF) at BNL. The test demonstrated systematic intensity dependent beam enlargement on YAG monitors, compared to other diagnostics. Possible mechanisms of the effect have been studied. The quantitative examination was performed and compared to the developed phenomenological models. Limitations on the use of YAG:Ce diagnostics are discussed with respect to the high-brightness electron sources.
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