Second Annual Workshop on Accelerator Instrumentation

Name: Second Annual Workshop on Accelerator Instrumentation

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1 paper from the conference:

title:	Progress towards a turn-by-turn beam profile monitor for the Fermilab Booster
format:	conference procceeding
conference:	Second Annual Workshop on Accelerator Instrumentation
year:	1991
4 authors:	J. B. Rosenzweig | Bharadwaj, V. | Lackey, J. | Zhou, P.
abstract:	Describes the design and pre-installation testing of a turn-by-turn beam profile monitor for the Fermilab Booster. this non-intrusive monitor collects the ions created by beam particle collisions with the residual gas onto a microchannel plate (MCP) detector using a large (50-100 kV/m) clearing field, to obtain a projected image of the beam distribution in a given plane. The output of the MCP is an anode strip array which gives a 48 channel image with 1.5 mm resolution. The strip current signal is digitized on a turn-by-turn basis to potentially generate more than 16000 beam profiles in one Booster cycle. The purpose of this device is to aid in understanding the effects which drive the transverse emittance growth in the Booster, which may have time scales as short as one turn. (6 References).
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